MATSCEN 6715
Transcript Abbreviation:
Prin Char Mat
Course Description:
Fundamentals of beam-solid interactions and their application to the characterizing the structure and composition of materials. The emphasis of this course will be on techniques utilizing X-ray and electron probes.
Course Levels:
Graduate (5000-8000 level)
Designation:
Elective
Required
General Education Course:
(N/A)
Cross-Listings:
(N/A)
Credit Hours (Minimum if “Range”selected):
2.00
Max Credit Hours:
2.00
Select if Repeatable:
Off
Maximum Repeatable Credits:
(N/A)
Total Completions Allowed:
(N/A)
Allow Multiple Enrollments in Term:
No
Course Length:
14 weeks (autumn or spring)
12 weeks (summer only)
Off Campus:
Never
Campus Location:
Columbus
Instruction Modes:
In Person (75-100% campus; 0-24% online)
Prerequisites and Co-requisites:
Prereq: Grad standing in MatScEn or WeldEng, or permission of instructor.
Electronically Enforced:
No
Exclusions:
Not open to students with credit for 715.
Course Goals / Objectives:
Techniques utilizing X-ray and electron probes
Check if concurrence sought:
No
Contact Hours:
| Topic | LEC | REC out-of-class | REC in-class | Weekly LAB out-of-class | Weekly LAB in-class |
|---|---|---|---|---|---|
| Introduction to X-Ray Diffraction - Generation of X-Rays - Basic Diffraction Theory - Powder Diffractometry | 0.0 | 0.0 | 0 | 0.0 | 0 |
| Introduction to Transmission Electron Microscopy - Electron interaction with matter - Electron diffraction - Imaging modes and defect analysis | 0.0 | 0.0 | 0 | 0.0 | 0 |
| Introduction to Scanning Electron Microscopy - Electron generation - Detectors and Imaging modes - Crystallographic analysis with Orientation Microscopy | 0.0 | 0.0 | 0 | 0.0 | 0 |
| Spectroscopy Using Electron Probes | 0.0 | 0.0 | 0 | 0.0 | 0 |
| Spectroscopy Using Photon Probes | 0.0 | 0.0 | 0 | 0.0 | 0 |
| Spectroscopy Using Ion Probes | 0.0 | 0.0 | 0 | 0.0 | 0 |
| Total | 0 | 0 | 0 | 0 | 0 |
Grading Plan:
Letter Grade
Course Components:
Lecture
Grade Roster Component:
Lecture
Credit by Exam (EM):
No
Grades Breakdown:
| Aspect | Percent |
|---|---|
| Midterm | 45% |
| Final | 45% |
| Homework | 10% |
Representative Textbooks and Other Course Materials:
| Title | Author | Year |
|---|---|---|
| Transmission Electron Microscopy: A Textbook for Materials Science | D. B. Williams and C. B. Carter, Plenum Press, New York (2nd edition 2009) |
ABET-CAC Criterion 3 Outcomes:
(N/A)
ABET-ETAC Criterion 3 Outcomes:
(N/A)
ABET-EAC Criterion 3 Outcomes:
(N/A)
Embedded Literacies Info: