Introduction to Integrated Circuits Test and Measurement

ECE 5120

Transcript Abbreviation: 
IC Test

Course Description: 
Parametric testing techniques for analog, digital, mixed and RF ICs, DSP-based testing; noise effects on accuracy; Design-for-Test and Built-in-Self Tests.

Course Levels: 
Undergraduate (1000-5000 level)
Graduate (5000-8000 level)

Designation: 
Elective

General Education Course:
(N/A)

Cross-Listings:
(N/A)