ECE 5033
Transcript Abbreviation:
Electron Interface
Course Description:
Provides the fundamental and practical basis for designing, processing, and characterizing the interfaces controlling the next generations of microelectronic and optoelectronic device structures.
Course Levels:
Undergraduate (1000-5000 level)
Graduate
Designation:
Elective
General Education Course
(N/A)
Cross-Listings
(N/A)
Credit Hours (Minimum if “Range”selected):
3.00
Max Credit Hours
(N/A)
Select if Repeatable:
Off
Maximum Repeatable Credits
(N/A)
Total Completions Allowed
(N/A)
Allow Multiple Enrollments in Term:
No
Course Length:
14 weeks (autumn or spring)
12 weeks (summer only)
Off Campus:
Never
Campus Location:
Columbus
Instruction Modes:
In Person (75-100% campus; 0-24% online)
Prerequisites and Co-requisites:
Prereq: 3030 or MATSCENG 3271; or Grad standing in Engineering, Biological Science, or Math and Physical Sciences.
Electronically Enforced:
Yes
Exclusions
(N/A)
Course Goals / Objectives:
Acquire a physical understanding of the fundamental electronic properties of semiconductor surfaces and interfaces
Learn to communicate in essay form the role of surfaces and interfaces in electrical engineering
Provide students with necessary background to understand the principle of new devices as new technologies develop
Check if concurrence sought:
No
Contact Hours:
| Topic | LEC | REC | LAB | LAB Inst |
|---|---|---|---|---|
| Overview, motivation, and historical background | 2.0 | 0.0 | 0.0 | 0 |
| Electrical measurements of semiconductor-metal contacts | 1.0 | 0.0 | 0.0 | 0 |
| Interface states | 2.0 | 0.0 | 0.0 | 0 |
| Ultrahigh vacuum technology | 1.0 | 0.0 | 0.0 | 0 |
| Surface analysis: Electron, photon and ion spectroscopy overview | 1.0 | 0.0 | 0.0 | 0 |
| Photoemission spectroscopy | 3.0 | 0.0 | 0.0 | 0 |
| Particle-solid scattering: electrons, Auger electron spectroscopy, & electron energy loss spectroscopy | 3.0 | 0.0 | 0.0 | 0 |
| Particle-solid scattering: ions, Rutherford backscattering spectrometry & secondary ion mass spectrometery | 2.0 | 0.0 | 0.0 | 0 |
| Electron diffraction | 1.0 | 0.0 | 0.0 | 0 |
| Scanned probe microscopy and spectroscopy | 1.0 | 0.0 | 0.0 | 0 |
| Optical spectroscopies: modulation, ellipsometry, Raman, surface photovoltage, cathodoluminescence | 4.0 | 0.0 | 0.0 | 0 |
| Electronic materials surfaces: growth, diffusion, etching, bonding, epitaxy | 3.0 | 0.0 | 0.0 | 0 |
| Adsorbates on semiconductors | 4.0 | 0.0 | 0.0 | 0 |
| Metals on semiconductors | 5.0 | 0.0 | 0.0 | 0 |
| Semiconductor heterojunctions | 5.0 | 0.0 | 0.0 | 0 |
| Future electronic interfaces & new directions | 2.0 | 0.0 | 0.0 | 0 |
| Total | 40 | 0 | 0 | 0 |
Grading Plan:
Letter Grade
Course Components:
Lecture
Grade Roster Component:
Lecture
Credit by Exam (EM):
No
Grades Breakdown:
| Aspect | Percent |
|---|---|
| Midterm essay | 40% |
| Final term paper | 60% |
| Extra credit homework problems | 0 |
Representative Textbooks and Other Course Materials:
| Title | Author | Year |
|---|---|---|
| An Essential Guide to Electronic Material Surfaces and Interfaces | Leonard J. Brillson |
ABET-CAC Criterion 3 Outcomes
(N/A)
ABET-ETAC Criterion 3 Outcomes
(N/A)
ABET-EAC Criterion 3 Outcomes:
| Outcome | Contribution | Description |
|---|---|---|
| 1 | Substantial contribution (3-6 hours) | an ability to identify, formulate, and solve complex engineering problems by applying principles of engineering, science, and mathematics |
| 3 | Substantial contribution (3-6 hours) | an ability to communicate effectively with a range of audiences - pre-2019 EAC SLO (g) |
| 6 | Substantial contribution (3-6 hours) | an ability to develop and conduct appropriate experimentation, analyze and interpret data, and use engineering judgment to draw conclusions |
| 7 | Substantial contribution (3-6 hours) | an ability to acquire and apply new knowledge as needed, using appropriate learning strategies |
Embedded Literacies Info
(N/A)
Attachments
(N/A)
Additional Notes or Comments
(N/A)