MATSCEN 6741
Transcript Abbreviation:
Elect Micrscpy Lab
Course Description:
Transmission Electron Microscopy with emphasis on practical methods.
Course Levels:
Graduate
Designation:
Elective
General Education Course
(N/A)
Cross-Listings
(N/A)
Credit Hours (Minimum if “Range”selected):
2.00
Max Credit Hours:
2.00
Select if Repeatable:
Off
Maximum Repeatable Credits
(N/A)
Total Completions Allowed
(N/A)
Allow Multiple Enrollments in Term:
No
Course Length:
7 weeks (autumn or spring)
4 weeks (summer only)
14 weeks (autumn or spring)
12 weeks (summer only)
Off Campus:
Never
Campus Location:
Columbus
Instruction Modes:
In Person (75-100% campus; 0-24% online)
Prerequisites and Co-requisites:
Prereq: Grad standing; or permission of instructor.
Electronically Enforced:
No
Exclusions
(N/A)
Course Goals / Objectives:
Operation, alignment, and calibration of the TEM
Electron Diffraction, Bright Field, Dark Field, and STEM imaging.
X-ray analysis in the S/TEM.
Biological sample imaging and preparatory imaging for cryo-TEM
Check if concurrence sought:
No
Contact Hours:
| Topic | LEC | REC | LAB | LAB Inst |
|---|---|---|---|---|
| Basic Operation I--SEM vs. TEM, identification of column parts, gun operation, saturation, gun tilt/trans, condenser aperture, condenser stig | 1.0 | 0.0 | 3.0 | 0 |
| Basic Operation II--Eucentric height, rotation center, objective aperture, focus (grain, fresnel fringes), Objective stig. FEG vs. Thermionic | 1.0 | 0.0 | 3.0 | 0 |
| Imaging--Taking photos, exposure, film exchange, loading & developing | 1.0 | 0.0 | 3.0 | 0 |
| Diffraction--basic powder diffraction, reciprocal space | 1.0 | 0.0 | 3.0 | 0 |
| Objective aperture--function of Objective aperture, BF/DF, CTF, defocus | 1.0 | 0.0 | 3.0 | 0 |
| STEM--microprobe/nanoprobe, HAADF | 1.0 | 0.0 | 3.0 | 0 |
| Kikuchi Lines/Orientation; Negative staining | 1.0 | 0.0 | 3.0 | 0 |
| EDX; Screening of Negatively Stained Sample | 1.0 | 0.0 | 3.0 | 0 |
| EELS; Tissue Sample Preparation I | 1.0 | 0.0 | 3.0 | 0 |
| HRTEM/HRSTEM; Tissue Sample Preparation II | 1.0 | 0.0 | 3.0 | 0 |
| Image Analysis--MIPAR, ImageJ/FIJI, Photoshop | 1.0 | 0.0 | 3.0 | 0 |
| Tomography; Preparation of Cryo-EM Samples | 1.0 | 0.0 | 3.0 | 0 |
| Titan condenser system; Screening of Cryo-EM Samples (Lecture only) | 1.0 | 0.0 | 0.0 | 0 |
| Total | 13 | 0 | 36 | 0 |
Grading Plan:
Letter Grade
Course Components:
Lecture
Lab
Grade Roster Component:
Lecture
Credit by Exam (EM):
No
Grades Breakdown:
| Aspect | Percent |
|---|---|
| Lab reports (6 at 16.7% each) | 83% |
| Practical Exam | 17% |
Representative Textbooks and Other Course Materials:
| Title | Author | Year |
|---|---|---|
| Transmission Electron Microscopy: A Textbook for Materials Science | D.B. Williams and C.B. Carter | |
| Practical Electron Microscopy in Materials Science | J.W. Edington | |
| Electron Microscopy of Thin Crystals | P. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, M.J. Whelan |
ABET-CAC Criterion 3 Outcomes
(N/A)
ABET-ETAC Criterion 3 Outcomes
(N/A)
ABET-EAC Criterion 3 Outcomes
(N/A)
Embedded Literacies Info
(N/A)
Attachments
(N/A)
Additional Notes or Comments
(N/A)