MATSCEN 2241
Transcript Abbreviation:
Struc Char Mater
Course Description:
Atomic structure of materials and its determination using X-ray diffraction techniques. Introduction crystalline defects and microstructure. Characterizing and quantifying materials microstructure using optical and electron microscopy.
Course Levels:
Undergraduate (1000-5000 level)
Designation:
Required
General Education Course
(N/A)
Cross-Listings
(N/A)
Credit Hours (Minimum if “Range”selected):
3.00
Max Credit Hours
(N/A)
Select if Repeatable:
Off
Maximum Repeatable Credits
(N/A)
Total Completions Allowed
(N/A)
Allow Multiple Enrollments in Term:
No
Course Length:
14 weeks (autumn or spring)
12 weeks (summer only)
Off Campus:
Never
Campus Location:
Columbus
Instruction Modes:
In Person (75-100% campus; 0-24% online)
Prerequisites and Co-requisites:
Prereq: 2010, Physics 1250 or 1260, Math 1151 or 1161, and Chem 1210 or 1250; and enrollment as MatScEn-BS student; or permission of instructor.
Electronically Enforced:
No
Exclusions:
Not open to students with credit for both 341 or 342.
Course Goals / Objectives:
Relationship to MSE Program Outcomes:
Applies basic science and engineering concepts to develop a fundamental understanding of atomic structure, defects and microstructural features in materials
Applies basic science and engineering concepts to develop a fundamental understanding of atomic structure, defects and microstructural features in materials
Students are presented with the basic operation and capabilities of the principal characterization methods used in materials science, namely XRD, optical microscopy and SEM
Understand how microstructure and crystalline defects affect the properties of materials, and how these features can be characterized?concepts that are fundamental for graduate research and employment in the area of materials design
Check if concurrence sought:
No
Contact Hours:
| Topic | LEC | REC | LAB | LAB Inst |
|---|---|---|---|---|
| Atomic Structure of Materials - Common structures for metals, semiconductors ceramics and polymers - Defining directions and planes - Anisotropy and effect on properties - Point defects - Amorphous materials and examples | 9.0 | 0.0 | 0.0 | 0 |
| Introduction to X-Ray and Electron Diffraction - X-ray and electron sources - Bragg’s law - Atomic scattering factor and structure factor - Phase identification and texture measurement - Electron Back-Scattered Diffraction | 6.0 | 0.0 | 0.0 | 0 |
| Dislocations and Interfaces - Basics of dislocation structure - Energy and forces associated with dislocations - Structure and energy of surfaces and grain boundaries - Structure of interphase boundaries - Connections to macroscopic properties | 9.0 | 0.0 | 0.0 | 0 |
| Optical and Scanning Electron Microscopy - Instrumentation - Types of signals - Imaging in the OM and the SEM - Resolution, aberrations, depth of field - Comparison of SEM and optical microscopy - Live/remote demo using the Phenom or Quanta | 6.0 | 0.0 | 0.0 | 0 |
| Stereology and Quantitative Image Analysis - Need for stereology and quantitative microscopy - Measurement of key microstructural features - Statistics in stereology | 6.0 | 0.0 | 0.0 | 0 |
| Energy Dispersive Spectroscopy - Basics, need for compositional analysis - Principles of compositional analysis - Capabilities, limitations - Resolution and uncertainty | 3.0 | 0.0 | 0.0 | 0 |
| Spectroscopy Using Photon and Ion Probes - Photon interactions with matter - Raman, IR, UV and Optical Spectroscopy - Ion interactions with matter - Rutherford Backscattering Spectroscopy - Secondary Ion Mass Spectroscopy | 3.0 | 0.0 | 0.0 | 0 |
| Total | 42 | 0 | 0 | 0 |
Grading Plan:
Letter Grade
Course Components:
Lecture
Grade Roster Component:
Lecture
Credit by Exam (EM):
No
Grades Breakdown:
| Aspect | Percent |
|---|---|
| Homework and Projects | 34% |
| Mid-term Exam | 33% |
| Final Exam | 33% |
Representative Textbooks and Other Course Materials:
| Title | Author | Year |
|---|---|---|
| Introduction to Materials Science and Engineering | Callister | |
| Electron Microscopy and Analysis, 3rd ed., 2000 | P. J. Goodhew, F. J. Humphreys and R. Beanland | |
| Grade A Notes compilation of several chapters from (X-Ray Diffraction). | Cullity | |
| Grade A Notes compilation of several chapters from (Crystalline Defects). | Hull and Bacon |
ABET-CAC Criterion 3 Outcomes
(N/A)
ABET-ETAC Criterion 3 Outcomes
(N/A)
ABET-EAC Criterion 3 Outcomes:
| Outcome | Contribution | Description |
|---|---|---|
| 1 | Significant contribution (7+ hours) | an ability to identify, formulate, and solve complex engineering problems by applying principles of engineering, science, and mathematics |
| 2 | Substantial contribution (3-6 hours) | an ability to apply engineering design to produce solutions that meet specified needs with consideration of public health, safety, and welfare, as well as global, cultural, social, environmental, and economic factors |
| 4 | Some contribution (1-2 hours) | an ability to recognize ethical and professional responsibilities in engineering situations and make informed judgments, which must consider the impact of engineering solutions in global, economic, environmental, and societal contexts |
| 6 | Substantial contribution (3-6 hours) | an ability to develop and conduct appropriate experimentation, analyze and interpret data, and use engineering judgment to draw conclusions |
| 7 | Some contribution (1-2 hours) | an ability to acquire and apply new knowledge as needed, using appropriate learning strategies |
Embedded Literacies Info
(N/A)
Attachments
(N/A)
Additional Notes or Comments
(N/A)