Introduction to Integrated Circuits Test and Measurement

ECE 5120

Transcript Abbreviation:

IC Test

Course Description:

Parametric testing techniques for analog, digital, mixed and RF ICs, DSP-based testing; noise effects on accuracy; Design-for-Test and Built-in-Self Tests.

Course Levels:

Undergraduate (1000-5000 level)
Graduate

Designation:

Elective

General Education Course

(N/A)

Cross-Listings

(N/A)